| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 11,63 | 46,53 | Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states
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| 0,00 | 0,00 | Modeling of dielectric response of GexSbyTez (GST) materials
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| 2,01 | 14,04 | Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
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| 10,14 | 30,42 | Reflectance of non-uniform thin films
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| 0,00 | 0,00 | Characterization of optical thin films exhibiting defects
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| 64,10 | 192,31 | Influence of cross-correlation effects on the optical quantities of rough films
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| 8,90 | 44,52 | Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films
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| 4,45 | 26,71 | Influence of technological conditions on mechanical stresses inside diamond-like carbon films
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| 0,00 | 0,00 | Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly
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| 0,52 | 3,12 | Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody
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| 0,00 | 0,00 | Influence of the temperature on properties of plasma polymerised organosilicon coatings
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| 17,39 | 34,78 | Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
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| 1,34 | 6,72 | Optical measurement of mechanical stresses in diamond-like carbon films
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| 17,39 | 34,78 | Optical properties of NiO thin films prepared by pulsed laser deposition technique
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| 17,39 | 34,78 | Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
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| 10,18 | 30,55 | Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
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| 9,13 | 18,25 | Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry
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| 0,00 | 0,00 | Influence of silicon, oxygen and nitrogen admixtures on the properies of plasma deposited amorphous diamond-like carbon coating
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| 11,59 | 34,78 | Spectroscopic ellipsometry of sinusoidal surface-relief gratings
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| 8,43 | 16,85 | Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
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| 0,00 | 0,00 | Ellipsometry in characterization of thin films
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| 1,89 | 5,68 | Combination of optical methods and atomic force microscopy at characterization of thin film systems
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| 0,00 | 0,00 | Deposition of protective couatings in RF organosilicon discharges
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| 0,00 | 0,00 | Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings
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| 1,65 | 8,24 | Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge
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| 0,00 | 0,00 | Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge
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| 9,71 | 38,84 | Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films
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| 0,00 | 0,00 | Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX
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| 0,00 | 0,00 | Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings
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| 1,55 | 4,64 | Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy
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| 0,00 | 0,00 | Mechanical properties of nanocrystaline diamond films
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| 0,00 | 0,00 | Mechanické vlastnosti nanokrystalických diamantových vrstev
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| 0,00 | 0,00 | Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias
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| 1,03 | 6,18 | Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation
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| 0,00 | 0,00 | Modeling of DLC Optical Properties Based on Parameterization of Density of States
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| 0,00 | 0,00 | Modeling of optical constants of organosilicon thin films by parameterization of denstity of states
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| 10,98 | 21,95 | Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces
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| 2,75 | 8,24 | Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry
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| 0,00 | 0,00 | Optical quantities of rough films calculated by Rayleigh-Rice theory
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| 8,71 | 60,95 | Optical Characterization of Ultrananocrystalline Diamond Films
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| 15,24 | 60,95 | Modeling of optical constants of diamond-like carbon
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| 2,81 | 8,42 | Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films
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| 1,87 | 9,36 | Optical characterization of non-stoichiometric silicon nitride films
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| 10,88 | 43,54 | Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry
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| 0,00 | 0,00 | NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES
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| 0,00 | 0,00 | Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies
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| 3,15 | 15,76 | Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
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| 0,00 | 0,00 | Deposition and analysis of thin films produced in atmospheric pressure glow discharge
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| 0,48 | 4,80 | Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings
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| 11,76 | 47,05 | Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges
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| 4,95 | 29,68 | Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films
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| 4,13 | 28,90 | Deposition of protective coatings in rf organosilicon discharges
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| 1,83 | 7,34 | Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films
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| 42,84 | 128,51 | Models of dielectric response in disordered solids
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| 0,00 | 0,00 | Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers
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| 1,32 | 5,28 | UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction
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| 0,00 | 0,00 | Study of DLC Coatings Deposited on Plastic Substrates
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| 0,00 | 0,00 | Study of Mechanical Properties of NCD Coatings
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| 0,00 | 0,00 | Studying an influence of a nucleation phase on nanocrystalline diamond film properties
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| 0,00 | 0,00 | Studium DLC vrstev na plastových substrátech
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| 0,00 | 0,00 | Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition
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| 0,00 | 0,00 | Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques
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| 0,00 | 0,00 | *Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou
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| 0,00 | 0,00 | *Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou
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(c) Michal Bulant, 2011