| Body na spoluautora | Body za publikaci pro MU | Odkaz ISVaV | | 18,17 | 18,17 | Mid-IR plasmonic antennas on silicon-rich oxinitride absorbing substrates: Nonlinear scaling of resonance wavelengths with antenna length
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| 23,15 | 46,29 | Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives
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| 4,68 | 14,04 | 1.3 mum emission from InAs/GaAs quantum dots
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| 2,24 | 6,72 | Anisotropy of Absorption and Luminescence of Multilayer InAs/GaAs Quantum Dots
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| 22,84 | 22,84 | In-situ spectroscopic ellipsometry: optimization of monitoring and closed-loop-control procedures
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| 2,34 | 9,36 | Interpretation of in-plane infrared response of high-Tc cuprate superconductors involving spin fluctuations using quasiparticle spectral functions
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| 3,36 | 6,72 | Infrared Response of Heavily Doped p-type Si and SiGe Alloys from Ellipsometric Measurements
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| 4,79 | 4,79 | Polarized light and ellipsometry
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| 12,74 | 38,23 | Elongation of InAs/GaAs quantum dots from magnetophotoluminescence measurements
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| 4,18 | 12,54 | Infrared vibrations of interstitial oxygen in silicon-rich SiGe alloys
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| 6,27 | 12,54 | Infrared spectroscopy of oxygen interstitials and precipitates in nitrogen-doped silicon
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| 4,68 | 9,36 | Raman and infrared studies of La1-ySryMn1-xMxO3 (M=Cr, Co, Cu, Zn, Sc or Ga): Oxygen disorder and local vibrational modes
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| 4,57 | 18,28 | Photoluminescence and magnetophotoluminescence of circular and elliptical InAs/GaAs quantum dots
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| 0,00 | 0,00 | Multiplate misalignment artifacts in rotating-complensator ellipsometry: Analysis and data treatment
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| 3,51 | 14,04 | Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel
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| 2,24 | 6,72 | Electron states and magnetophotoluminescence of elongated InAs/GaAs quantum dots
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| 1,68 | 6,72 | Frequency- and temperature-dependent conductivity at the metal-insulator transition in phosphorus doped silicon studied by far-infrared ellipsometry
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| 2,81 | 14,04 | Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry
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| 14,72 | 44,16 | Lateral shape of InAs/GaAs quantum dots in vertically correlated structures
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| 0,00 | 0,00 | Optical study of YBa2Cu3O7/LCMO superlattices
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| 7,15 | 14,29 | Photoluminescence and magnetophotoluminescence of vertically stacked InAs/GaAs quantum dot structures
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| 55,65 | 55,65 | Spatial resolution of degradation in stabilized polystyrene and polypropylene plaques exposed to accelerated photodegradation or heat aging
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| 7,02 | 14,04 | Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes
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(c) Michal Bulant, 2011